Modeling local item dependence in C-tests with the loglinear Rasch model

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Standard

Modeling local item dependence in C-tests with the loglinear Rasch model. / Baghaei, Purya; Christensen, Karl Bang.

I: Language Testing, Bind 40, Nr. 3, 2023, s. 820-827.

Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › fagfællebedømt

Harvard

Baghaei, P & Christensen, KB 2023, 'Modeling local item dependence in C-tests with the loglinear Rasch model', Language Testing, bind 40, nr. 3, s. 820-827. https://doi.org/10.1177/02655322231155109

APA

Baghaei, P., & Christensen, K. B. (2023). Modeling local item dependence in C-tests with the loglinear Rasch model. Language Testing, 40(3), 820-827. https://doi.org/10.1177/02655322231155109

Vancouver

Baghaei P, Christensen KB. Modeling local item dependence in C-tests with the loglinear Rasch model. Language Testing. 2023;40(3):820-827. https://doi.org/10.1177/02655322231155109

Author

Baghaei, Purya ; Christensen, Karl Bang. / Modeling local item dependence in C-tests with the loglinear Rasch model. I: Language Testing. 2023 ; Bind 40, Nr. 3. s. 820-827.

Bibtex

@article{2bf3ad70a2fb466098a63339f808c7ee,
title = "Modeling local item dependence in C-tests with the loglinear Rasch model",
abstract = "C-tests are gap-filling tests mainly used as rough and economical measures of second-language proficiency for placement and research purposes. A C-test usually consists of several short independent passages where the second half of every other word is deleted. Owing to their interdependent structure, C-test items violate the local independence assumption of IRT models. This poses some problems for IRT analysis of C-tests. A few strategies and psychometric models have been suggested and employed in the literature to circumvent the problem. In this research, a new psychometric model, namely, the loglinear Rasch model, is used for C-tests and the results are compared with the dichotomous Rasch model where local item dependence is ignored. Findings showed that the loglinear Rasch model fits significantly better than the dichotomous Rasch model. Examination of the locally dependent items did not reveal anything as regards their contents. However, it did reveal that 50% of the dependent items were adjacent items. Implications of the study for modeling local dependence in C-tests using different approaches are discussed.",
author = "Purya Baghaei and Christensen, {Karl Bang}",
year = "2023",
doi = "10.1177/02655322231155109",
language = "English",
volume = "40",
pages = "820--827",
journal = "Language Testing",
issn = "0265-5322",
publisher = "SAGE Publications",
number = "3",

}

RIS

TY - JOUR

T1 - Modeling local item dependence in C-tests with the loglinear Rasch model

AU - Baghaei, Purya

AU - Christensen, Karl Bang

PY - 2023

Y1 - 2023

N2 - C-tests are gap-filling tests mainly used as rough and economical measures of second-language proficiency for placement and research purposes. A C-test usually consists of several short independent passages where the second half of every other word is deleted. Owing to their interdependent structure, C-test items violate the local independence assumption of IRT models. This poses some problems for IRT analysis of C-tests. A few strategies and psychometric models have been suggested and employed in the literature to circumvent the problem. In this research, a new psychometric model, namely, the loglinear Rasch model, is used for C-tests and the results are compared with the dichotomous Rasch model where local item dependence is ignored. Findings showed that the loglinear Rasch model fits significantly better than the dichotomous Rasch model. Examination of the locally dependent items did not reveal anything as regards their contents. However, it did reveal that 50% of the dependent items were adjacent items. Implications of the study for modeling local dependence in C-tests using different approaches are discussed.

AB - C-tests are gap-filling tests mainly used as rough and economical measures of second-language proficiency for placement and research purposes. A C-test usually consists of several short independent passages where the second half of every other word is deleted. Owing to their interdependent structure, C-test items violate the local independence assumption of IRT models. This poses some problems for IRT analysis of C-tests. A few strategies and psychometric models have been suggested and employed in the literature to circumvent the problem. In this research, a new psychometric model, namely, the loglinear Rasch model, is used for C-tests and the results are compared with the dichotomous Rasch model where local item dependence is ignored. Findings showed that the loglinear Rasch model fits significantly better than the dichotomous Rasch model. Examination of the locally dependent items did not reveal anything as regards their contents. However, it did reveal that 50% of the dependent items were adjacent items. Implications of the study for modeling local dependence in C-tests using different approaches are discussed.

U2 - 10.1177/02655322231155109

DO - 10.1177/02655322231155109

M3 - Journal article

VL - 40

SP - 820

EP - 827

JO - Language Testing

JF - Language Testing

SN - 0265-5322

IS - 3

ER -

ID: 370577123